4 results
Correlative Imaging of Phase Separation in Fe2TiO4 Thin Films Prepared by Conventional Ga and Xe Plasma FIB Processing
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 186-187
- Print publication:
- August 2020
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Investigation of slice thickness for FIB tomography in a plasma focused ion beam system
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 858-859
- Print publication:
- August 2018
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Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 178-179
- Print publication:
- July 2016
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Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 332-333
- Print publication:
- August 2014
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